[SymbolVega 0]

Добрый день, уважаемые!

Прошу совета для решения следующей проблемы.

Эмулятор GaoTek XDS510, подключенный к jtag разъему DSK6713 (Spectrum Digital) не проходит тесты xdsprobe:

 

C:\CCStudio_v3.1\cc\bin>xdsprobe -f gao.cfg -p 0x240 -g -c

 

-----[select the controller]-------------------------------------------------

 

This utility has selected an XDS510 class product.

This utility will load the adapter 'Gao.dll'.

This utility will operate on port address '0x0240'.

TDS510USB Emulator found (USB 2.0 port)

The emulator adapter is named 'C:\CCStudio_v3.1\cc\bin\Gao.dll'.

The emulator adapter is titled 'Custom block-mode adapter for use with an TDS510

'.

The emulator adapter is version '3.3.0'.

The emulator adapter is uses 'Block-Mode'.

The controller has an insertion length of '16' (0x0010).

The controller has a revision number of '1' (0x0001).

The controller type is 'The venerable TBC (74ACT8990)'.

The local memory has a base address of '0' (0x000000).

The local memory has a word capacity of '262144' (0x040000).

 

-----[Perform the scan-path length test on the JTAG IR and DR]---------------

 

This scan-path test uses blocks of 512 32-bit words.

 

The test for the JTAG IR instruction scan-path length succeeded.

The JTAG IR instruction scan-path length is 46 bits.

 

The test for the JTAG DR bypass scan-path length succeeded.

The JTAG DR bypass scan-path length is 1 bits.

 

-----[Perform the scan-path given data test on the JTAG IR]------------------

 

This scan-path test uses blocks of 512 32-bit

words that repeat the data pattern 0x5533CCAA.

 

This scan-path test will be applied forever

using all of the 10 different test-cases.

 

Test 1 Word 16: scanned out 0x5533CCAA and scanned in 0x33CCA8AA.

Test 1 Word 17: scanned out 0x5533CCAA and scanned in 0x33CCAA55.

Test 1 Word 18: scanned out 0x5533CCAA and scanned in 0x33CCAA55.

Test 1 Word 19: scanned out 0x5533CCAA and scanned in 0x33CCAA55.

Test 1 Word 20: scanned out 0x5533CCAA and scanned in 0x5533CE55.

Test 1 Word 80: scanned out 0x5533CCAA and scanned in 0xFFFFFFFE.

Test 1 Word 81: scanned out 0x5533CCAA and scanned in 0xFFFFFFFF.

Test 1 Word 82: scanned out 0x5533CCAA and scanned in 0xFFFFFFFF.

The details of the first eight errors have been provided.

The utility will now report only the count of failed tests.

Test suites performed: 523, skipped: 208, failed: 105

Some of the 32-bit data values were corrupted - 0.2 percent.

The JTAG IR given data test has failed.

 

-----[Perform the scan-path given data test on the JTAG DR]------------------

 

This scan-path test uses blocks of 512 32-bit

words that repeat the data pattern 0x5533CCAA.

 

This scan-path test will be applied forever

using all of the 10 different test-cases.

 

Test 1 Word 17: scanned out 0x5533CCAA and scanned in 0x33CCAA2A.

Test 1 Word 18: scanned out 0x5533CCAA and scanned in 0x33CCAA55.

Test 1 Word 19: scanned out 0x5533CCAA and scanned in 0x33CCAA55.

Test 1 Word 20: scanned out 0x5533CCAA and scanned in 0x554CAA55.

Test 1 Word 81: scanned out 0x5533CCAA and scanned in 0x79954AA6.

Test 1 Word 82: scanned out 0x5533CCAA and scanned in 0x79954AA6.

Test 1 Word 83: scanned out 0x5533CCAA and scanned in 0x79954AA6.

Test 1 Word 84: scanned out 0x5533CCAA and scanned in 0x5533CAA6.

The details of the first eight errors have been provided.

The utility will now report only the count of failed tests.

Test suites performed: 783, skipped: 312, failed: 157

Some of the 32-bit data values were corrupted - 0.2 percent.

The JTAG DR given data test has failed.

 

На следующий запуск теста выдает:

 

...

 

-----[Perform the scan-path length test on the JTAG IR and DR]---------------

 

This scan-path test uses blocks of 512 32-bit words.

 

The test for the JTAG IR instruction scan-path length failed.

The many-ones then many-zeros tested length was -13712 bits.

The many-zeros then many-ones tested length was 46 bits.

 

The test for the JTAG DR bypass scan-path length succeeded.

The JTAG DR bypass scan-path length is 1 bits.

 

-----[Perform the scan-path given data test on the JTAG IR]------------------

 

This scan-path test uses blocks of 512 32-bit

words that repeat the data pattern 0x5533CCAA.

 

This scan-path test will be applied forever

using all of the 10 different test-cases.

 

 

-----[An error has occurred and this utility has aborted]--------------------

 

This error is generated by TI's USCIF driver.

 

The value is `-270' (0xfffffef2).

The title is: `SC_ERR_SCN_LENGTH_CONTROL'.

 

The explanation is:

The length of the scan is too large for the emulators controller.

 

 

Т.е. работает через раз.

Пробовал с драйвером wtusb5102.dll - ситуация аналогичная.

unify_linkdly изменял - при значениях отличных от нуля процент ошибок резко возрастает.

Вот такие дела.

[SM 0]

С целостностью сигналов проблема. Однозначно.

[SymbolVega 0]

С целостностью сигналов проблема. Однозначно.

 

Где можно почитать по этому поводу?

[SM 0]

Где можно почитать по этому поводу?

Почитать???? Осциллографом такие вещи смотрят, а не читают :)

[SymbolVega 0]

Почитать???? Осциллографом такие вещи смотрят, а не читают :)

 

Добрался до осциллографа:

 

1. TCK (12 МГц):

 

2. TDI и TCK:

 

3.TDO и TCK:

 

4. Еще раз TDO/TCK:

 

5. TDI и TDO:

 

6. Еще раз TDI/TDO:

 

7. TDI/TDO в основном идут так:

 

8. Реже вот так:

 

 

Схема подключения сейчас соответствует

http://tiexpressdsp.com/index.php/XDS_Targ...d_Configuration

 

Буду признателен за высказанные соображения.

[SM 0]

звон на TDI просто ужасный. Думаю, что на TMS не сильно лучше. В нем и проблемы. Еще неизвестно что там на TDO по его приходу в эмулятор. Разбирайтесь с проблемами с согласованием сигналов, с кабелем, с качеством буферов эмулятора.

[Edmundo 0]

Буду признателен за высказанные соображения.

Надо еще TMS посмотреть. Гляньте, может быть это Вам поможет?